xiii, 390 p. : 24 cm

Includes bibliographical references (p. 379-385) and index

A Modern View of Reliability Concepts and Design for Reliability -- What Is a Failure? -- Three Reasons Why Products Fail -- History of Reliability in the United States -- Overview of Reliability Modeling -- Six Basic Approaches to Modeling Product Reliability -- Failure Mechanisms -- Establishing Reliability Specifications -- An Overview of Reliability Planning -- Elements of Design for Reliability -- Deploying Reliability Requirements -- Reliability Prediction -- Cost of Reliability and Product Testing -- Reliability Bathtub Curve -- Life-Cycle Costing -- Enablers for a Successful Reliability Planning Effort -- Reliability Growth Management -- FMEA/FMECA/DVP&R -- Preliminaries, Definitions, and Use of Order Statistics in Reliability Estimation -- Reliability Metrics -- Reliability Functions -- Population Moments -- Empirical Estimates of F(t) and Other Reliability Metrics: Use of Order Statistics -- Naive Rank Estimator -- Mean and Median Rank Estimators -- Use of Rank Estimators of F(t) as a Plotting Position in a Probability Plot -- Beta-Binomial and Kaplan-Meier Confidence Bands on Median Rank Estimator -- Empirical Estimates of Other Reliability Metrics: R(t), [lambda](t), f(t), and H(t) -- Working with Grouped Data -- Working with Censored Data -- Categorizing Censored Data Sets -- Special Staged Censored Data Sets -- Nonparametric Estimation of Reliability Metrics Based on Censored Data -- Developing Empirical Reliability Estimates of Warranty or Grouped Censored Data -- A Survey of Distributions Used in Reliability Estimation -- Normal Distribution -- Central Tendency -- Properties of Normal Distribution -- Lognormal Distribution -- Exponential Distribution -- Weilbull Distribution -- Weibull Power-Law Hazard Function -- Weibull Survival Function -- Properties of the Weibull Distribution -- Three-Parameter Weibull -- Extreme Value (Gumbel) Distribution -- Other Distributions Used in Reliability -- Logistic and Log-Logistic Distributions -- Gamma and Log-Gamma Distributions -- Miscellaneous Other Noteworthy Distributions -- Mixtures and Competing Failure Models -- Weibull Population Moments -- Overview of Estimation Techniques -- Rank Regression and Probability Plotting Techniques -- Normal Probability Plotting Techniques -- Weibull Probability Plotting Techniques -- Maximum Likelihood Estimation -- Introduction to ML Estimation -- Development of Likelihood Confidence Intervals -- Maximum Likelihood Estimation of Normal Parameters, [mu] and [sigma], for Complete Sample Sets -- ML Estimation of Normal Parameters [mu] and [sigma superscript 2] in the Presence of Censoring -- ML Estimation of Weibull Parameters [theta] and [beta] -- Simulation-Based Approaches for the Development of Normal and Weibull Confidence Intervals -- Other Estimators -- Best Linear Estimators of [mu] and [sigma] -- Recommendations for Choice of Estimation Procedures -- Estimation of Exponential Distribution Properties -- Estimating the Exponential Hazard-Rate Parameter, [gamma], or MTTF Parameter, [theta] -- Exponential Confidence Intervals -- Use of Hazard Plots -- Three-Parameter Weibull -- Monte Carlo Estimation -- Reference Tables and Charts -- Distribution Fitting -- Goodness-of-Fit Procedures -- Goodness-of-Fit Tests Based on Differences Between Empirical Rank and Fitted Distributions -- Rank Regression Tests -- Other Goodness-of-Fit Tests -- Test Sample-Size Determination -- Validation/Verification Testing -- Verification Testing -- Specifying a Reliability Requirement -- Success-Failure Testing -- Testing to Failure -- Strategies for Reducing Sample-Size Requirements -- Underlying Distributional Assumption -- Success Testing -- Bayesian Adjustment to Success Formula -- Success-Failure Testing -- Use of Binomial Nomograph -- Exact Formulas for Binomial Confidence Limits in Success-Failure Testing -- Large-Sample Confidence Limit Approximation on Reliability -- Bayesian Adjustment to Success-Failure Testing Formula -- Correctness of Binomial Success-Testing Formula -- Exponential Test-Planning Formulas -- Success Testing Under an Exponential Distribution Assumption Using Alternate Formula -- Extended Bogey Testing Under Exponential Life Model -- Extended Success Testing--Exponential Distribution -- Risks Associated with Extended Bogey Testing -- Reduced Test Duration -- Weibull Test Planning -- Weibayes Formulas -- Adequacy of Weibayes Model -- Chrysler Success-Testing Requirements on Sunroof Products -- Tail Testing -- Failure Testing -- Other Management Considerations -- Binomial Distribution -- Bayesian Estimation of Failure Fraction, p -- Weibull Properties -- Accelerated Testing -- Accelerated Testing -- Benefits/Limitations of Accelerated Testing -- Two Basic Strategies for Accelerated Testing -- Highly Accelerated Life Testing (HALT) -- Accelerated Life Test -- Accelerated Cycling or Time-Compression Strategies -- Stress-Life Relationships at Two Different Stress Levels -- Use of Physical Models -- The Arrhenius Model -- Other Acceleration Models -- Use of Linear Statistical Models in Minitab for Evaluating Life Versus Stress Variables Relationships -- Arrhenius Linear Model in Minitab -- Use of Regression with Life Data Procedure in Minitab -- Use of Proportional Hazards Models -- Q-Q Plots -- ML Estimation of Parameters in Regression Model with Multiply Censored Life Data -- Engineering Approaches to Design Verification -- Computer-Aided Engineering Approaches -- Finite-Element Analysis -- Other Computer-Aided Engineering (CAE) Approaches -- Probabilistic Design -- Simple Strength Versus Stress Models -- Multivariate Strength Versus Stress Competition -- Probabilistic FEA -- Parametric Models -- First Order Reliability Method (FORM) -- Likelihood Estimation (Advanced) -- Maximum Likelihood (ML) Point Estimation -- Maximum Likelihood Estimation of Exponential Hazard Parameter, [gamma] -- ML Estimates of Normal Parameters, [mu] and [sigma superscript 2] -- Worked-Out Example -- Weibull Distribution: ML Estimation of [beta] and [theta] -- ML Estimation of Three-Parameter Weibull Distribution -- Other Modified Estimation Procedures for the Three-Parameter Weibull Distribution -- ML-Based Approaches for Confidence Interval Estimation -- Exponential Confidence Intervals -- Asymptotic (Large-Sample) Confidence Intervals -- Confidence Intervals on Normal Metrics -- Algorithm by Wolynetz (1979) for Obtaining ML Estimates of Normal Parameters, [mu] and [sigma] -- Proof: The Exponential Total Unit Time on Test Variable, T, Follows a Gamma (r[gamma]) Distribution -- Comparing Designs -- Graphical Procedures Based on Probability or Rank Regression Plots -- Q-Q Plots -- Technical Note: Use of Q-Q Plots -- Inferential Statistics for Using Q-Q Plots -- Use of Likelihood Theory for Assessing Differences -- Approximate F-Test for Differences--Weibull and Exponential Distribution -- Test for Differences in the Exponential MTTF Parameter, [theta] -- Approximate Test for Differences with Weibull Shape Parameter -- Use of Approximate F-Tests

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